Matches 1 - 15 out of 15


Match Document Document Title
US20110063727 Method and system with indicating marks for projection film  
Indicia are established on the film to clearly indicate locations where cuts for splices may and may not be properly made. These indicia are different from each other to signify whether a cut can...
US20060146301 Print order receiving method, print order receiver, and print production system  
The print order receiver and print order receiving method acquire image data of first images of one order, input a print order with respect to the first images for individual package units of the...
US20060044534 Photographic film processor  
A check label on which an order identification number and a bar code thereof are recorded is attached to a leading portion of a photographic film and an envelope for containing the photographic...
US20070019180 Image-forming device having brush/drum processor  
An image-forming device includes a processing member in the form of a brush/drum processor. The processing member includes a rotatable vacuum drum with a surface that is adapted to receive an...
US20090100392 Securing Authenticity of Integrated Circuit Chip  
A system and method are provided for securely manufacturing a device at a foundry. For example, an integrated circuit chip may be securely fabricated at an untrusted foundry by later verifying...
US20080252867 OVERLAY MARK, AND FABRICATION AND APPLICATION OF THE SAME  
An overlay mark is described, including a portion of a lower layer having two x-directional and two y-directional bar-like patterns therein, and two x-directional and two y-directional photoresist...
US20110096309 Method and System for Wafer Inspection  
A method and system for evaluating a lithographic pattern obtained using multiple-patterning lithographic processing are presented. In one aspect, the method includes aligning a target design with...
US20080158527 PROCESSOR UNIT WITH PROVISION FOR AUTOMATED CONTROL OF PROCESSING PARAMETERS  
An imaging device for preparing a printing surface for a printing operation transfers information related to how the printing precursor should be processed to a processor. The processor is...
US20090303451 LIGHT SOURCE DEVICE, OPTICAL SCANNING DEVICE, AND IMAGE FORMING APPARATUS  
A light source device includes a light source that includes a vertical cavity surface emitting laser; a drive circuit that drives the light source; and a circuit board that includes at least one...
US20080002165 Method And Apparatus For Producing Printed-Circuit-Board  
Printed circuit boards having patterns of uniform line width can be produced. A lamination apparatus superposes a resist layer on a substrate. Further, the substrate is exposed to light carrying...
US20140160451 SUBSTRATE REFERENCE IMAGE CREATION METHOD, SUBSTRATE DEFECT INSPECTION METHOD, SUBSTRATE REFERENCE IMAGE CREATION APPARATUS, SUBSTRATE DEFECT INSPECTION UNIT AND NON-TRANSITORY COMPUTER STORAGE MEDIUM  
In the present invention, a planar distribution of pixel values in a picked-up substrate image is decomposed into a plurality of pixel value distribution components through use of a Zernike...
US20170068173 Metrology Method and Apparatus, Substrate, Lithographic System and Device Manufacturing Method  
A metrology target formed by a lithographic process on a substrate includes a plurality of component gratings. Images of the target are formed using +1 and −1 orders of radiation diffracted by the...
US20160274472 Inspection Apparatus and Methods, Substrates Having Metrology Targets, Lithographic System and Device Manufacturing Method  
Disclosed is an inspection apparatus for use in lithography. It comprises a support for a substrate carrying a plurality of metrology targets; an optical system for illuminating the targets under...
US20110170081 Maskless exposure apparatuses and frame data processing methods thereof  
Example embodiments are directed to a maskless exposure apparatus to efficiently process frame data of a Digital Micro-mirror Device (DMD) and a frame data processing method thereof. The frame...
US20110096310 METHOD AND APPARATUS FOR MEASUREMENT AND CONTROL OF PHOTOMASK TO SUBSTRATE ALIGNMENT  
A method, structure, system of aligning a substrate to a photomask. The method includes: directing incident light through a pattern of clear regions transparent to the incident light in an...

Matches 1 - 15 out of 15