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US20110193580 Fatal Failure Diagnostics Circuit and Methodology  
A fault diagnostic circuit (100) and associated method of operation are described for testing an FET device (114) for a gate-drain short failure (113) by floating the FET gate during a...
US20140263613 BOARD TEST SYSTEM AND METHOD  
A system includes a microprocessor that executes microcode designed to query all or some of the electronic circuits that are on a device under test. The results of the query are written to an RFID...
US20130088249 METHOD OF DETECTING A FAULT WITH THE MEANS FOR DE-ICING A PROBE FOR MEASURING A PHYSICAL PARAMETER  
A method of detecting a fault in a de-icer probe for measuring a physical parameter on an airplane engine, the method including: prior to starting an engine, measuring a first value of the...
US20150247893 DEVICES AND METHOD FOR TESTING POWER-ON RESET VOLTAGE  
A system having a power on reset circuit including a voltage divide), a multiplexer coupled to two outputs of the voltage divider, a first comparator coupled to the multiplexer and a reference, a...
US20120326739 SELF-ISOLATING MIXED DESIGN-RULE INTEGRATED YIELD MONITOR  
Assessing open circuit and short circuit defect levels in circuits implemented in state of the art ICs is difficult when using conventional test circuits, which are designed to assess continuity...
US20100308852 SHIELDED ANTENNA FOR SYSTEM TEST OF A NON-CONTACT VOLTAGE DETECTOR  
A system and method of conducting a full system test on a non-contact voltage detector while simultaneously shielding the voltage detector's antenna from stray electric fields is disclosed. When a...
US20100295568 SELF TESTING FAULT CIRCUIT APPARATUS AND METHOD  
A self testing fault circuit interrupter device comprising a fault circuit comprising at least one line monitoring circuit, at least one line interrupting circuit and at least one fault detector...
US20140002121 SYSTEM AND METHOD FOR ELECTRONIC TESTING OF PARTIALLY PROCESSED DEVICES  
Systems and methods are provided for testing partially completed three-dimensional ICs. Example methods may incorporate one or more of the following features: design for testing (DFT); design for...
US20120187969 BUILT-IN TEST FOR AN OVERVOLTAGE PROTECTION CIRCUIT  
An overvoltage protection circuit connected to protect electrical components from overvoltage conditions includes a blocking diode connected in series with a transient voltage suppression device...
US20110095774 TESTING A NONVOLATILE CIRCUIT ELEMENT HAVING MULTIPLE INTERMEDIATE STATES  
A test circuit tests a nonvolatile circuit element having multiple intermediate states. The test circuit includes a waveform generator configured to apply a waveform to the circuit element...
US20130293250 INTEGRATED CIRCUIT WITH STRESS GENERATOR FOR STRESSING TEST DEVICES  
An integrated circuit device includes at least one test device and a stress generator coupled to the test device and operable to cycle the at least one test device to generate an AC stress. A...
US20150075401 SQUIB DRIVER DIAGNOSTIC CIRCUIT AND METHOD  
A diagnostic circuit is provided that includes a FET having a source connected to a first node, a drain, and a gate; a first switch connecting a current-supply node to one of the gate and a second...
US20140320155 CRITICAL CAPACITOR BUILT IN TEST  
An electronic circuit and method for carrying out built in test of a capacitor connected to, and arranged to suppress noise at, an input of an electrical circuit is disclosed. The electronic...
US20130265070 SELF TEST OF MEMS ACCELEROMETER WITH ASICS INTEGRATED CAPACITORS  
An apparatus comprises a micro-electromechanical system (MEMS) sensor including a first capacitive element and a second capacitive element and an integrated circuit (IC). The IC includes a switch...
US20120049875 SCHMITT TRIGGER WITH TEST CIRCUIT AND METHOD FOR TESTING  
A Schmitt trigger circuit having a test circuit and method for testing are provided. The Schmitt trigger test circuit includes switches for reconfiguring the Schmitt trigger for testing by...
US20120049891 COMPARATOR CIRCUIT WITH HYSTERESIS, TEST CIRCUIT, AND METHOD FOR TESTING  
A comparator has a first input, a second input, an output, a control electrode of a first hysteresis transistor coupled to the output, and a control electrode of a second hysteresis transistor...
US20100090718 SEMICONDUCTOR DEVICE, AND DEVELOPMENT SUPPORTING DEVICE  
States of LSI internal signals (100 to 107) are monitored. Signal name information (31), signal state information (32), and information (33) about time in an LSI when a signal undergoes a state...
US20080204055 CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES  
An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be...
US20090206865 ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP TRENCH SIDEWALL RELIABILITY  
A test structure and testing method are provided for characterizing the time-dependent drift in the parasitic PFET leakage current that flows along the sidewall of a deep trench isolation...
US20150260787 SYSTEM-ON-CHIP AND LOAD IMBALANCE DETECTING METHOD THEREOF  
A system-on-Chip (SoC) and a load imbalance detecting method of the same are provided. The SoC includes at least one master, a plurality of slaves, an interconnect, a measurement block, a central...
US20080278190 Testing fuse configurations in semiconductor devices  
Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external...
US20090230986 SEMICONDUCTOR INTEGRATED CIRCUIT, FUSE CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND CONTROL METHOD OF THE SAME  
A fuse circuit for a semiconductor integrated circuit includes a control unit configured to activate a fuse set control signal in response to an external command signal, and a plurality of fuse...
US20120065919 BUILT-IN SELF-TEST CIRCUIT-BASED RADIATION SENSOR, RADIATION SENSING METHOD AND INTEGRATED CIRCUIT INCORPORATING THE SAME  
A radiation sensor for an integrated circuit (IC), a radiation sensing method and an IC incorporating the sensor or the method. In one embodiment, the radiation sensor includes: (1) a built-in...
US20110080185 METHOD FOR TESTING THROUGH-SILICON-VIA AND THE CIRCUIT THEREOF  
The method and circuit for testing a TSV of the present invention exploit the electronic property of the TSV under test. The TSV under test is first reset to a first state, and is then sensed at...
US20110080184 METHOD FOR TESTING THROUGH-SILICON-VIA AND THE CIRCUIT THEREOF  
The method and circuit for testing a TSV of the present invention exploit the electronic property of the TSV under test. The TSV under test is first reset to a first state, and is then sensed at...
US20090322365 INTEGRATED MEMS METROLOGY DEVICE USING COMPLEMENTARY MEASURING COMBS  
The present invention provides a device for in-situ monitoring of material, process and dynamic properties of a MEMS device. The monitoring device includes a pair of comb drives, a cantilever...
US20080229264 Semiconductor evaluation apparatus, semiconductor evaluation method and semiconductor evaluation program  
The present invention provides a semiconductor evaluation apparatus. The semiconductor evaluation apparatus includes: a first integrated circuit; a second integrated circuit; a test section; a...
US20140132292 TEST BOARD  
A test board is disclosed. The test board serves as an interface for testing a conference phone. The test board includes a plurality of test channel selectors. Each of the test channel selectors...
US20090096476 Method of inspecting semiconductor circuit having logic circuit as inspection circuit  
A semiconductor circuit includes an inspection circuit for inspecting terminal open of the semiconductor circuit. The semiconductor circuit has a plurality of input terminals. The semiconductor...
US20110068814 PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS  
An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus...
US20140266272 GROUND FAULT CIRCUIT INTERRUPTER AND METHOD  
A ground fault interrupter circuit and a method for operating a ground fault interrupter that includes configuring the ground fault interrupter to perform a plurality of self tests. The ground...
US20130093445 Voice-Activated Pulser  
A voice-activated pulser can trigger an oscilloscope or a meter, upon a simple voice command, thereby enabling hands-free signal measurements. The pulser can also be used to control the circuit...
US20140167796 WIRING STRUCTURE AND DISPLAY DEVICE INCLUDING THE SAME  
There is provided a wiring structure comprising a board, which includes a connection pattern, and a plurality of flexible printed circuit boards (FPCBs). Each of the flexible printed circuit...
US20110148446 CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS  
An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer...
US20110140725 OVER CURRENT PROTECTION TEST SYSTEM  
A system includes a switching power supply, an electric load connected to the switching power supply, a voltage regulation circuit, and a detect device. The voltage regulation circuit is connected...
US20130108065 METHODS FOR INVOKING TESTING USING REVERSIBLE CONNECTORS  
Electronic devices may be provided with audio circuits and controller circuitry configured to support test mode operations. A connector such as a reversible connector may be inserted into a mating...
US20150260786 INTEGRATED CIRCUIT AUTHENTICATION  
Systems and methods for authenticating integrated circuits. An example integrated circuit may comprise: a plurality of functional units electrically coupled to a power source; and an...
US20130002278 Methods and Devices for Determining Sensing Device Usability  
Methods and devices for determining sensing device usability, e.g., for self-monitoring and point of care devices. In one embodiment, the invention is to a method of determining device usability,...
US20120182033 DIE TESTING USING TOP SURFACE TEST PADS  
Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the...
US20140028336 PRINTED CIRCUIT BOARD  
Disclosed herein is a printed circuit board. In the printed circuit board provided with a router machining line to be partitioned into a unit region in which a plurality of unit substrates are...
US20130106452 REAL-TIME ON-CHIP EM PERFORMANCE MONITORING  
An integrated circuit, testing structure, and method for monitoring electro-migration (EM) performance. A method is described that includes method for measuring on-chip electro-migration (EM)...
US20140320154 FIELD DEVICE WITH SELF-TESTING OF A PIEZOELECTRIC TRANSDUCER  
An industrial process field device having a piezoelectric transducer performs self-testing of the condition of the piezoelectric transducer during a self-test mode. A charging current is supplied...
US20080174331 Structure of test area for a semiconductor tester  
Devices and methods for DC and SLT (system level test) integration are disclosed. The DC circuit and the SLT circuit are integrated into the same device. Therefore, the DUT (device under testing)...
US20120146674 DETERMINING LOCAL VOLTAGE IN AN ELECTRONIC SYSTEM  
A system for measuring a test voltage level (Vx) in a location within a chip is presented. The system includes an on-chip measurement device with an on-chip comparator and an on-chip storage. The...
US20080231287 EVALUATION BOARD AND FAILURE LOCATION DETECTION METHOD  
An evaluation board, on which is mounted a chip to be evaluated is provided. Particularly, the evaluation board includes a monitoring window for monitoring a power supply part, a ground part, and...
US20130063170 TEST CIRCUIT ALLOWING PRECISION ANALYSIS OF DELTA PERFORMANCE DEGRADATION BETWEEN TWO LOGIC CHAINS  
A test circuit for measuring a gate delay as a function of stress is disclosed. The test circuit includes an oscillator, a reference gate chain, a test gate chain, and a counter. The counter...
US20080036487 Integrated circuit wearout detection  
An integrated circuit is provided with latency detecting circuitry for detecting signal generation latency within one or more functional circuits and in response thereto to generate a wearout...
US20130002279 Methods and Devices for Determining Sensing Device Usability  
Methods and devices for determining sensing device usability, e.g., for point of care immunoassay devices. In one embodiment, the invention is to a method of determining device usability,...
US20150042369 METHOD AND AN APPARATUS OF DETERMINING PERFORMANCE OF AN INTEGRATED CIRCUIT  
The present invention discloses an efficient method to determine the performance of an integrated circuit or a chip by instantiating a plurality of HPM in the integrated circuit to generate the...
US20140132295 DRIVE FAILURE PROTECTION  
The present techniques include methods and systems for detecting a failure in a capacitor bank of an electrical drive system. Embodiments include using discharge resistors to discharge capacitors...

Matches 1 - 50 out of 428 1 2 3 4 5 6 7 8 9 >