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US20130076381 Threshold-Based Temperature-Dependent Power/Thermal Management with Temperature Sensor Calibration  
A method and apparatus for temperature sensor calibration is disclosed. In one embodiment, an integrated circuit (IC) is tested at a first known temperature corresponding to a first temperature...
US20130033277 THERMAL AND STRESS GRADIENT BASED RC EXTRACTION, TIMING AND POWER ANALYSIS  
Timing, power and SPICE analysis are performed on a circuit layout, based on temperature and stress variations or gradient across the circuit layout. Specifically, the temperature and stress...
US20120223729 Adhesively Attached Stand-Offs On A Portable Pack For An Electronics Tester  
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on...
US20140125365 Testing Electronic Components on Electronic Assemblies with Large Thermal Mass  
An approach is provided in which a system under test is subjected to thermal cycling that include transferring the system under test between two different environments that generate two different...
US20120119767 POWER CYCLING TEST ARRANGEMENT  
A device instructs a power supply to provide a current to a power cycling test structure that includes a heat source interconnected with a package, via a first level interconnect mechanism, and a...
US20110128023 PROBE INSPECTING METHOD AND CURABLE RESIN COMPOSITION  
Disclosed are a probe inspecting method for confirming the state of a probe for inspecting electric characteristics of an object to be inspected; and a curable resin composition for use in the...
US20130015869 TEMPERATURE MEASUREMENT OF ACTIVE DEVICE UNDER TEST ON STRIP TESTER  
A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally...
US20150008946 ELECTRIC CONNECTING APPARATUS  
An apparatus includes a wiring base plate arranged on an upper side of a chuck top and having a wiring path connected to a tester, a probe card having a probe board spaced from the wiring base...
US20110204909 SOLAR MODULE TEST CONTROL  
A method for conditioning a photovoltaic module for testing includes setting an effective irradiance of a continuous light source at a target plane, configuring a test photovoltaic module to...
US20140043052 Integrated Chip with Heating Element and Reference Circuit  
Some aspects of the present disclosure relate to an apparatus that includes an integrated chip having a bandgap reference circuit and one or more heating elements. The bandgap reference circuit is...
US20130307572 BATTERY SIMULATION CIRCUIT  
A battery simulation circuit simulates a rechargeable battery. The battery simulation circuit includes an integrated amplifier, a voltage adjustment unit, a current limitation unit, and a feedback...
US20130234744 Diagnosis method and control unit for performing a diagnosis of a lambda sensor of the UEGO type of an exhaust system for an internal combustion engine  
A method performs a diagnosis of a lambda sensor of a “UEGO” type of an exhaust system for an internal-combustion engine. The lambda sensor includes a series of pins. The diagnosis method...
US20090140761 METHOD OF TESTING SEMICONDUCTOR DEVICE  
A method of testing a semiconductor device, which can reduce a period of time for testing a packaged semiconductor chip. First, semiconductor chips to be tested are classified in a lot unit. The...
US20110068813 IN-LINE CHARACTERIZATION  
An apparatus is provided and includes a thermally isolated device under test to which first and second voltages are sequentially applied, a local heating element to impart first and second...
US20110012632 Conductive Heating  
A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device...
US20130342230 High Throughput Current-Voltage Combinatorial Characterization Tool and Method for Combinatorial Solar Test Substrates  
Measuring current-voltage (I-V) characteristics of a solar cell using a lamp that emits light, a substrate that includes a plurality of solar cells, a positive electrode attached to the solar...
US20120212246 METHOD AND APPARATUS FOR TESTING IC  
A testing method includes measuring an electrical parameter of a device under test (DUT) and a corresponding temperature of the DUT one or more times, determining coefficients in a pre-constructed...
US20100007364 Hot Testing of Semiconductor Devices  
A testing apparatus for testing of integrated circuit devices at elevated temperatures comprises hot belt 111 is operable to transport integrated circuits from a main production line into a hot...
US20110012631 Conductive Heating  
A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured...
US20130076382 Apparatus and Method for Measurement of Radiation Intensity for Testing Reliability of Solar Cell, and Method for Testing Reliability of Solar Cell  
An apparatus and method for measurement of radiation intensity for testing reliability of a solar cell, and a method for testing the reliability of the solar cell. The apparatus includes a first...
US20140300378 System and Method for Gradient Thermal Analysis by Induced Stimulus  
A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a static thermal gradient is induced across at least a portion of the...
US20130141126 SIMULATION TEST CARD  
A simulation test card to simulate a peripheral card to be inserted into a system to be tested includes a board, an edge connector formed on a bottom side of the board, and a first heating...
US20140028337 METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBER  
In a method and a device for testing a test substrate under defined thermal conditions, a substrate that is to be tested is held by a temperature-controllable chuck and is set to a defined...
US20100201389 INTEGRATED UNIT FOR ELECTRICAL/RELIABILITY TESTING WITH IMPROVED THERMAL CONTROL  
In accordance with an aspect, a thermally-controllable integrated unit is configured to hold devices under test. The integrated unit includes at least one heater board, comprised of a...
US20110267082 Methodologies and Test Configurations for Testing Thermal Interface Materials  
Methodologies and test configurations are provided for testing thermal interface materials and, in particular, methodologies and test configurations are provided for testing thermal interface...
US20110115510 System and Method for Gradient Thermal Analysis by Induced Stimulus  
A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a laser creates a moving thermal gradient from a test site on the DUT...
US20140253154 PROBING METHOD, PROBE CARD FOR PERFORMING THE METHOD, AND PROBING APPARATUS INCLUDING THE PROBE CARD  
A probe method includes setting an allowable temperature range, the allowable temperature range including a test temperature and ensuring contact between a pad of a circuit substrate and a needle...
US20130181732 METHODS OF PREVENTING FREEZING OF RELAYS IN ELECTRICAL COMPONENTS  
Disclosed herein are methods of preventing freezing of relays in electrical components operated in specific atmospheric conditions. One such method described herein comprises monitoring a...
US20140253155 ADAPTIVE THERMAL CONTROL  
An adaptive thermal control system maintains and regulates an accurate and stable thermal environment for a device under test. The adaptive thermal control system includes (i) pre-trigger...
US20060238206 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts  
A measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts contains a cantilever with an electrically conductive probe tip, a...
US20090195264 High temperature test system  
A high temperature test system is adapted for testing a device under test (DUT) under a high temperature environment. The high temperature test system includes a preheating unit, a first moving...
US20080079456 TEST HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME  
Provided is a test handler for testing a semiconductor device mounted in a test tray with a test head disposed separately below the test tray under predetermined testing condition at high or low...
US20050151554 Cooling devices and methods of using them  
A method and device for cooling an electronic component during its manufacture, repair, or rework is disclosed. In certain examples, the cooling device includes a cooling device body, and...
US20100001753 Position changing apparatus for test handler and power transferring apparatus  
A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber....
US20140167795 ACTIVE FEEDBACK SILICON FAILURE ANALYSIS DIE TEMPERATURE CONTROL SYSTEM  
Fault analysis of high power integrated circuits face thermal management challenges. This invention employs thermal diodes incorporated in the device undergoing fault analysis, and a closed loop...
US20130257421 METHOD AND SYSTEM FOR PERFORMING ON-WAFER TESTING OF HEADS  
A method and system for testing a read transducer are described. The read transducer includes a read sensor fabricated on a wafer. A system includes a test structure that resides on the wafer. The...
US20110181313 EVALUATION DEVICE AND EVALUATION METHOD FOR SUBSTRATE MOUNTING APPARATUS AND EVALUATION SUBSTRATE USED FOR THE SAME  
There are provided an evaluation device and an evaluation method for a substrate mounting apparatus capable of simply evaluating a temperature control function of the substrate mounting apparatus...
US20110025354 INSPECTION APPARATUS FOR PHOTOVOLTAIC DEVICES  
The present invention provides an inspection apparatus for photovoltaic devices which electrifies the photovoltaic devices in a forward direction thereof to make the photovoltaic devices emit...
US20140176165 Apparatus for Three Dimensional Integrated Circuit Testing  
A three-dimensional integrated circuit testing apparatus comprises a probe card configured to couple a device-under-test of a three-dimensional integrated circuit with an automatic testing...
US20140021973 APPARATUS AND METHOD FOR POWER CYCLE TEST  
Provided is a power cycle test apparatus that eliminates the need to measure a thermal resistance in a power cycle test and that pursues power saving in the evaluation of IGBT reliability by...
US20080007285 Handler and method of testing semiconductor device by means of the handler  
An object of the present invention is to provide a handler and a testing method thereof which enable efficient measurements on a plurality of semiconductor devices. An arm control unit 106...
US20090128183 DEVICE FOR MEASURING THICKNESS AND SQUARE RESISTIVITY OF INTERCONNECTING LINES  
A microelectronic device comprising one or several metallic levels provided with one or several superposed metallic interconnecting levels and at least one test structure: at least one metallic...
US20130278279 METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPARATUS  
In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is...
US20090278546 SOLAR CELL TESTING APPARATUS  
A solar cell testing apparatus including a stage, a movable chuck, a light source and a plurality of probes is provided. The movable chuck is disposed on the stage and capable of carrying a sample...
US20070290702 System and method for thermal management and gradient reduction  
A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head,...
US20140015556 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH COMPLIANT PEDESTALS  
A test socket assembly, useful in association with a thermal control unit used to maintain a set point temperature on an IC device under test, has at least one compliant pedestal is configured to...
US20150185278 Temperature insensitive testing device and method  
The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to...
US20100327891 METHOD AND APPARATUS FOR THERMALLY CONDITIONING PROBE CARDS  
Embodiments of probe cards and methods for fabricating and using same are provided herein. In some embodiments, an apparatus for testing a device (DUT) may include a probe card configured for...
US20150247895 Test Handler and Circulation Method of Test Trays in Test Handler  
In accordance with an embodiment of the present invention, there is provided a circulation method of a test tray in a test handler, the method comprising: in case of a first mode of test of...
US20110221461 METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UNDER DEFINED THERMAL CONDITIONS  
The invention relates to a method for testing several electronic components (1) of a repetitive pattern under defined thermal conditions in a prober, which comprises a chuck (10) for holding the...
Matches 1 - 50 out of 175 1 2 3 4 >