Matches 151 - 175 out of 175 < 1 2 3 4


Match Document Document Title
US20160252571 INSPECTION METHOD FOR SEMICONDUCTOR SUBSTRATE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND INSPECTION DEVICE FOR SEMICONDUCTOR SUBSTRATE  
A manufacturing method of a semiconductor device is provided with an inspecting of a semiconductor substrate by an inspection method, the method including heating the semiconductor substrate,...
US20160231369 MEMS DEVICE POSITIONING APPARATUS, TEST SYSTEM, AND TEST METHOD  
A positioning apparatus includes a support structure, a positioning structure, and a fixture for retaining MEMS devices. A shaft spans between the support structure and the positioning structure,...
US20160146882 METHOD OF CONTACTING INTEGRATED CIRCUIT COMPONENTS IN A TEST SYSTEM  
The invention provides a method of contacting integrated circuit components in a test system for testing integrated circuit components comprises the steps of providing an atmosphere comprising an...
US20160131702 ASSEMBLING DEVICES FOR PROBE CARD TESTING  
An example process places dice that have been cut from a first semiconductor wafer on a second wafer. The example process includes arranging the dice in a pattern on a the second wafer, where the...
US20160116528 Thermal Control  
An example test system includes: a heating mechanism; a cooling mechanism; an instrument module having one or more interfaces to receive signals from a device under test (DUT), where the...
US20160109508 HEAT TREATMENT APPARATUS AND HEAT TREATMENT METHOD  
A substrate inspection apparatus includes a mounting table, an inspection unit, a temperature control unit and a medium channel. The mounting table mounts thereon a substrate on which a...
US20160109496 MEASUREMENT METHOD AND MEASUREMENT SYSTEM  
A measurement method includes: obtaining a first temperature characteristic of a crystal oscillator based on a plurality of oscillating frequencies observed when the crystal oscillator is...
US20160109485 ATE THERMAL OVERLOAD DETECTION AND RECOVERY TECHNIQUES  
A system including an automated test equipment (ATE) and an interface board. The interface board includes a temperature monitor that compares a sensor temperature to a predetermined temperature....
US20160061885 SEMICONDUCTOR DEVICE  
A semiconductor device including: an insulating substrate; a semiconductor element mounted on the insulating substrate; an internal printed circuit board disposed on the semiconductor element; and...
US20160054380 TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR  
A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature...
US20160054379 TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR  
A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature...
US20160054378 TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR  
A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature...
US20160054377 TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR  
A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature...
US20160047856 PROBE DEVICE  
A probe device, for performing an electrical test of a semiconductor device formed on a semiconductor wafer, includes a mounting table on which the semiconductor wafer is mounted, a driving...
US20160027705 METHODS AND STRUCTURES FOR DETECTING LOW STRENGTH IN AN INTERLAYER DIELECTRIC STRUCTURE  
A method for manufacturing a semiconductor device is disclosed. The method includes generating a thermo-mechanical stress within a plurality of layers of a wafer, and after generating the...
US20160025801 PROBE STATION FOR THE SIMULTANEOUS MEASUREMENT OF THERMAL AND ELECTRICAL CHARACTERISTICS OF THERMOELECTRIC MODULE  
The present invention relate to a probe station system which can measure thermal distribution and thermographic images, and more particularly, to such an probe station which can detect an...
US20160003894 TESTING SYSTEM WITH DIFFERING TESTING SLOTS  
A testing environment may have at least one controller connected to at least first and second testing slots positioned in a housing. The first testing slot can be configured with a first thermal...
US20150377956 METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERATURE PROFILING  
A methodology for inline characterization and temperature profiling that enables parallel measurement of device characteristics at multiple temperatures and the resulting device are disclosed....
US20150377946 STRUCTURE FOR TRANSMITTING SIGNALS IN AN APPLICATION SPACE BETWEEN A DEVICE UNDER TEST AND TEST ELECTRONICS  
An example structure for transmitting signals in an application space between a device under test (DUT) and test electronics includes: a circuit board that is part of an application space between...
US20150346242 High di/dt Capacity Measurement Hardware  
Hardware test systems are provided that have an electrical test loop with a minimum length of less than 200 mm, a maximum di/dt capacity of at least 1500A/μs and a minimum parasitic inductance of...
US20150309114 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE WITH HEATER SOCKET  
A laminated heater socket useful in association with an integrated circuit (IC) device tester is having a socket with an embedded integrated heater. This laminated heater socket configuration...
US20150276858 TEST APPARATUS AND CIRCUIT SUBSTRATE UNIT  
A test apparatus that tests a device under test, comprising first and second test substrates facing each other; test circuits provided respectively on a first substrate surface of the first test...
US20140176166 ELECTRONIC LOAD MODULE AND A METHOD AND A SYSTEM THEREFOR  
The present invention relates to an electronic load module and to a method and a system therefor. The method comprises receiving control data (301) from a connectable power controller via a data...
US20130271169 Apparatus and Method for Electronic Sample Preparation  
A method and apparatus for preparing electronic samples for a subsequent treatment, e.g., application of a failure analysis treatment. In one embodiment, an electronic device is mounted on a...
US20120299608 METHOD OF TESTING RELIABILITY OF SEMICONDUCTOR DEVICE  
The invention provides a method of testing reliability of a semiconductor device, wherein the semiconductor device has negative bias temperature instability NBTI. The method comprises steps of:...

Matches 151 - 175 out of 175 < 1 2 3 4