Matches 101 - 150 out of 175 < 1 2 3 4 >


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US20150137842 PROBER  
A prober includes: a wafer chuck having a conductive support surface; a movement rotation mechanism which moves and rotates the wafer chuck; a head stage which holds a probe holding portion; a...
US20120229129 PROBE STATION WITH MAGNETIC MEASUREMENT CAPABILITIES  
A system for probing with electrical test signals on an integrated circuit specimen in the external multidimensional magnetic field of controlled strength and orientation is provided by utilizing...
US20060038172 Apparatus and methods for wafer-level testing of the chip-scale semiconductor device packages  
A test chuck is configured for assembly with, and to test, semiconductor devices of a large-scale substrate. The test chuck includes a substrate with terminals that are arranged correspondingly to...
US20150137844 HANDLER APPARATUS AND TEST METHOD  
Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a...
US20140111233 APPARATUS, SYSTEMS AND METHODS FOR ENVIRONMENTAL CONTROLLED TESTING  
Apparatus, systems and methods are provided for controlling a radio frequency board on an individualized basis and with respect to one or more environmental conditions, for example, temperature,...
US20130181733 HANDLER APPARATUS AND TEST METHOD  
Provided is a handler apparatus which can connect devices under test to sockets of a test apparatus quickly and with low power consumption. The handler apparatus for conveying and connecting a...
US20150234005 MEMORY PACKAGE TEST JIG HAVING HARSH CONDITION CREATING STRUCTURE  
Disclosed herein is a memory package test jig having a harsh condition creating structure. The memory package test jig includes an upper jig which has package seating holes into which memory...
US20110241711 METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONS  
A method and an apparatus for verifying or testing test substrates, i.e. wafers and other electronic semiconductor components, in a prober under defined thermal conditions. Such a verifying...
US20140210498 ELECTRONIC APPARATUS HAVING IC TEMPERATURE CONTROL  
The use of a power sink function in IC testing results in a simple and rapid method for testing ICs, and assembled modules, at elevated temperature profiles without the use of environmental ovens....
US20120019274 ELECTRONIC APPARATUS HAVING IC TEMPERATURE CONTROL  
The use of a power sink function in IC testing results in a simple and rapid method for testing ICs, and assembled modules, at elevated temperature profiles without the use of environmental ovens....
US20140015557 Measurement Apparatus and Method  
A method and apparatus for extracting the contents (39) of voids (13) and/or pores present in a semiconductor device to obtain information indicative of the nature of the voids and/or pores, e.g....
US20110309849 INSPECTION METHOD FOR INSPECTING ELECTRIC CHARACTERISTICS OF DEVICES FORMED ON TARGET OBJECT  
An inspection method for inspecting electric characteristics of devices formed on a target object using an apparatus including a vertical drive mechanism for lifting and lowering a movable...
US20150084657 HEATING SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE USING A HEATING SYSTEM  
A heating system is described for generating heat and bringing heat to a semiconductor device under test. The heating system comprises a conduction heating unit comprising a heating resistor, a...
US20130141127 PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPECTION APPARATUS USING THE SAME  
The present invention provides a probe assembly for inspecting power semiconductor devices, which comprises (1) a probe block having more than one probe holding hole, (2) more than one probe, each...
US20120299609 POSITIONING AND SOCKETING FOR SEMICONDUCTOR DICE  
Devices and methods useful for testing bare and packaged semiconductor dice are provided. As integrated circuit chips become smaller and increasingly complex, the interface presented by a chip for...
US20120112777 ELECTRONIC DEVICE PUSHING APPARATUS, ELECTRONIC DEVICE TEST APPARATUS, AND INTERFACE DEVICE  
An electronic device pushing apparatus includes a pushing unit which has: a plurality of pushers which contact DUTs; and base plate on which the plurality of pushers are provided. A rigidity of...
US20050116729 Method and device for testing or calibrating a pressure sensor on a wafer  
A method is provided for testing or calibrating a pressure sensor of a plurality of pressure sensors formed in a wafer, wherein the pressure sensor has a pressure-sensitive portion and a signal...
US20110115508 DETERMINING CRITICAL CURRENT DENSITY FOR INTERCONNECT  
Solutions for determining a critical current density of a line are disclosed. In one embodiment a method of determining a critical current density in a line includes: applying a temperature...
US20150022226 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH COAXIAL SOCKET  
A coaxial socket useful in association with an integrated circuit (IC) device tester and having a conducting pin surrounded by an insulating layer and embedded in a conducting base. This coaxial...
US20120049874 SEMICONDUCTOR TEST CHIP DEVICE TO MIMIC FIELD THERMAL MINI-CYCLES TO ASSESS RELIABILITY  
A semiconductor test device including a plurality of conductive layers, each of the layers comprising integrated circuit devices, a plurality of insulating layers between the conductive layers, a...
US20150222228 METHOD FOR CHARACTERIZING A PHOTOVOLTAIC ELEMENT, DEVICE FOR CHARACTERIZING THE PHOTOVOLTAIC ELEMENT, ASSOCIATED PROGRAM AND STORAGE MEDIUM  
The method for characterizing a photovoltaic element (4) comprises a phase of studying (E1) a behaviour of the photovoltaic element (4) in response to the application of a light beam from a light...
US20140084952 SYSTEM AND METHOD FOR ANALYZING ELECTRONIC DEVICES HAVING OPPOSING THERMAL COMPONENTS  
A system for analyzing electronic devices includes an input station, a transport apparatus, an electric machine interface station, an electric machine interface, a support structure and first and...
US20150253376 APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPLES IN SEMICONDUCTOR PRODUCT ACCELERATION STUDIES  
A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first...
US20110267083 METHOD FOR MEASURING TRANSISTOR  
An object is to provide a measuring method with high reproducibility in a bias-temperature stress test of a transistor in which an oxide semiconductor is used for a semiconductor layer. Provided...
US20130249577 ACCELERATED LIFETIME TESTING APPARATUS AND METHODS FOR PHOTOVOLTAIC MODULES  
Methods and apparatus for performing an accelerated lifetime test on a photovoltaic device are provided. The method can include positioning a first photovoltaic device in a first holder adjacent...
US20070126454 Apparatus and method of detecting defective substrate  
An apparatus and method of detecting a functionally defective substrate includes a detection unit to detect a trend in change in a voltage of a power source when a substrate is heated by the power...
US20120113556 APPARATUS FOR TESTING ELECTRONIC DEVICES  
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large...
US20100201391 APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICES  
A test apparatus for testing semiconductor integrated circuits includes a test head, a probe card holder for detachably holding a probe card that probes a semiconductor device, a heater for...
US20060226863 Method and apparatus to adjust die frequency  
A method and apparatus are provided for adjusting a frequency of a die. This may include measuring characteristics of a die at various combinations of power supply voltage, body bias voltage...
US20150145540 SEMICONDUCTOR INSPECTION SYSTEM AND METHOD FOR PREVENTING CONDENATION AT INTERFACE PART  
Provided are a semiconductor inspection system and a method for preventing condensation at an interface part. The inspection system is characterized by being equipped with: a probe apparatus...
US20140132334 SEMICONDUCTOR INTEGRATED CIRCUIT AND AN OPERATING METHOD THEREOF, A TIMING VERIFYING METHOD FOR A SEMICONDUCTOR INTEGRATED CIRCUIT AND A TEST METHOD OF A SEMICONDUCTOR INTEGRATED CIRCUIT  
A semiconductor integrated circuit which includes a control circuit; and a power management integrated circuit (IC) configured to supply an operating voltage to the control circuit. The control...
US20140125366 METHOD FOR ESTIMATING THE END OF LIFETIME FOR A POWER SEMICONDUCTOR DEVICE  
The invention regards an method for estimating the end of lifetime for a power semiconductor device, such as an IGBT power module, comprising the steps of; establishing the temperature of the...
US20170176516 Thermal Head with a Thermal Barrier for Integrated Circuit Die Processing  
A thermal heat for integrated circuit die processing is described that includes a thermal barrier. In one example, the thermal head has a ceramic heater configured to carry an integrated circuit...
US20170176515 THERMAL CLUTCH FOR THERMAL CONTROL UNIT AND METHODS RELATED THERETO  
Featured are devices, systems and methods for testing an electronic device, such as an integrated chip. Such a testing method includes disposing a thermal clutch between a variable heat sink that...
US20170153287 SEMICONDUCTOR STRUCTURE AND METHOD FOR OPERATING THE SAME  
An integrated circuit (IC) and a method for operating the IC are provided. The IC comprises a device under test and a first heater. The first heater is located at a first side of the device and...
US20170146594 PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT BETWEEN A PROBE AND A DEVICE UNDER TEST DURING A TEMPERATURE CHANGE  
Probe systems and methods for automatically maintaining alignment between a probe and a device under test (DUT) during a temperature change. The methods include collecting an initial image of a...
US20170139002 APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE  
An apparatus for evaluating a semiconductor device includes: a chuck stage; an insulating substrate; a plurality of probes; a temperature adjustment unit; an evaluation/control unit; and a probe...
US20170115339 DEVICE AND METHOD FOR CONTROLLING IC TEMPERATURE  
A device for controlling IC temperature capable of bringing a device-under-test to a predetermined temperature includes a compressor, temperature controller element, thermal sensing element, heat...
US20170089950 MASSIVELY PARALLEL WAFER-LEVEL RELIABILITY SYSTEM AND PROCESS FOR MASSIVELY PARALLEL WAFER-LEVEL RELIABILITY TESTING  
A massively parallel wafer-level reliability system to test a reliability of wafers includes: a test platform; stations disposed on the test platform, wherein an individual test station receives a...
US20170059635 CONDUCTIVE TEMPERATURE CONTROL  
A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is...
US20170059442 SEAL MONITOR FOR PROBE OR TEST CHAMBER  
A method of checking a seal of a probe chamber or test chamber (thermal chamber) during a freezing temperature chamber condition. The thermal chamber provided includes a probe card or a contactor...
US20170023640 APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPLES IN SEMICONDUCTOR PRODUCT ACCELERATION STUDIES  
A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first...
US20170023639 LEAKAGE POWER CHARACTERIZATION AT HIGH TEMPERATURES FOR AN INTEGRATED CIRCUIT  
A system for post-silicon leakage characterization is configured to apply a rail voltage to a hardware component; cause the hardware component to operate at a particular frequency; cause a cooling...
US20170016952 Electronic Component Testing  
A fixture for connecting a printed wiring assembly (PWA) to an acceleration table for subjecting the PWA to highly accelerated stress screen (HASS) testing. The fixture comprises a member and...
US20170010323 Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer Inspection Method  
The present invention provides a semiconductor wafer inspection apparatus and a semiconductor wafer inspection method that can suppress warpage in a semiconductor wafer due to a temperature...
US20160308490 DEVICE FOR CONTROLLING SAMPLE TEMPERATURE DURING PHOTOELECTRIC MEASUREMENT AND SOLAR CELL MEASUREMENT DEVICE USING SAME  
Disclosed herein is a device for controlling a sample temperature during photoelectric measurement of the sample. The device for controlling a sample temperature during photoelectric measurement...
US20160306004 MEASUREMENT APPARATUS AND METHOD  
A method and apparatus for extracting the contents of voids and/or pores present in a semiconductor device to obtain information indicative of the nature of the voids and/or pores, e.g. to assist...
US20160291083 INTEGRATED CIRCUIT TEST TEMPERATURE CONTROL MECHANISM  
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data...
US20160259016 ELECTRONIC LOAD MODULE AND A METHOD AND A SYSTEM THEREFOR  
The present invention relates to an electronic load module and to a method and a system therefor. The method comprises receiving control data (301) from a connectable power controller via a data...
US20160258998 ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CONNECTED SENSORY PINS  
A system for electromigration testing is disclosed. The system includes a conductive member, a cap layer of insulative material over at least a portion of a top surface of the conductive member, a...

Matches 101 - 150 out of 175 < 1 2 3 4 >