Matches 51 - 100 out of 175 < 1 2 3 4 >


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US20100109696 ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHUCK HAVING DIFFERENT COEFFICIENTS OF THERMAL EXPANSION  
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on...
US20100097091 Methodology for Bias Temperature Instability Test  
A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a...
US20110248734 ELECTRONIC DEVICE TEST APPARATUS  
An electronic device test apparatus which can optimize throughput and costs is provided. An electronic device test apparatus 1 comprises: a test cell cluster 10 having cell groups 11A to 11H each...
US20140021972 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH SOCKETS HAVING SECURED AND REPLACEABLE BUSHINGS  
A test socket assembly, useful in association with a thermal control unit (TCU) used to maintain a set point temperature on an IC device under test, has alignment holes with bushings that are...
US20140021974 APPARATUS AND METHOD FOR POWER CYCLE TEST  
Provided are a power cycle test apparatus and a power cycle test method that can efficiently reproduce nearly a level of stress that may occur in failure mode in actual environments, the apparatus...
US20090174426 Semiconductor Device with Fault Detection Function  
A semiconductor device (1) detecting damage to the peripheral part of a chip which could potentially grow into a defect includes: a wire (3) formed along the outer periphery of a semiconductor...
US20060103404 System and method for testing dynamic resistance during thermal shock cycling  
A system includes a temperature chamber (100), a text fixture (402), a test coupon (400), a data acquisition unit (404), an ohmmeter (406) and a computer (410). The temperature chamber (100)...
US20150198659 RADIATOR MODULE SYSTEM FOR AUTOMATIC TEST EQUIPMENT  
A radiator module system for automatic test equipment, including a test arm and a closed-loop circulating cooling device disposed on the test arm. The test arm includes a test head, and an...
US20120105087 APPARATUS FOR TESTING CIRCUIT BOARDS OF COMPUTING DEVICES AND METHODS FOR SAME  
Embodiments provide apparatus for testing a primary PCB of a native computing device, the apparatus including a plurality of fixture mounting posts selectively positionable in alignment with...
US20120098558 CONCENTRATOR PHOTOVOLTAIC MEASURING DEVICE  
A concentrator photovoltaic measuring device includes a platform, an enclosing mask, a converging lens, a concentration unit, a first temperature regulation unit, a second temperature regulation...
US20090160475 Test pin reduction using package center ball grid array  
An apparatus and method for reducing the number of package pins in a chip package which must be budgeted for test purposes. In one embodiment, the invention achieves this by housing test balls in...
US20100289511 METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBER  
In a method and a device for testing a test substrate under defined thermal conditions, a substrate that is to be tested is held by a temperature-controllable chuck and is set to a defined...
US20150247894 TEMPERATURE CONTROL SYSTEM  
A temperature control system for a test chamber includes a control circuit, a temperature increasing circuit, and a temperature decreasing circuit. The control circuit detects a temperature in the...
US20150198660 METHOD FOR BREAKING DOWN HARDWARE POWER INTO SUB-COMPONENTS  
A system, method and computer program product for enabling efficient and accurate post-silicon leakage power characterization of semiconductor chips at very high temperatures. The system and...
US20080150563 Probe card for semiconductor IC test and method of manufacturing the same  
Provided is a probe card for semiconductor IC test on one principal surface of which are formed a plurality of probe electrodes, such as bump electrodes (5), and which has, in a peripheral portion...
US20130027068 APPARATUS AND METHOD FOR TESTING OPERATION PERFORMANCE OF AN ELECTRONIC MODULE UNDER SPECIFIED TEMPERATURE  
An apparatus includes a predetermined function circuit board having a primary area for accepting an electronic module to be tested, a secondary area coupled electrically with the primary area, and...
US20140239990 TESTING CONTAINER  
A testing container includes a right-parallelepiped-like container, electrical components of a transformer test system which are arranged in the container and which represent a respective heat...
US20130113509 Temperature Control System for IC Tester  
A temperature control system for IC tester, comprising: a test socket; a compressing device including a heat exchanger and a thermoelectric cooler (TEC); and a test head having a temperature...
US20070046305 Wafer holder and wafer prober having the same  
A wafer holder that can improve throughput by improving heating rate and thermal uniformity of a prober, as well as a wafer prober having the same are provided. The wafer holder has a chuck top...
US20050151549 Probe method, prober, and electrode reducing/plasma-etching processing mechanism  
A probe method of this invention includes a step of reducing an electrode of a wafer by using a forming gas, and a step of bringing the electrode and a probe pin into contact with each other in a...
US20060220670 Method for measuring cell gap variation of liquid crystal panel and apparatus thereof  
A method for measuring a cell gap of a liquid crystal panel, comprises providing a detection device, holding the liquid crystal panel vertically, heating the liquid crystal panel to a detection...
US20140062513 Integrated Circuit Test Temperature Control Mechanism  
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data...
US20120025856 TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD  
Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the...
US20140097860 THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION  
An integrated circuit device comprises component devices (that include primary and alternate devices) and storage elements connected to the component devices. The storage elements store different...
US20150008945 ELECTRIC CONNECTING APPARATUS  
An apparatus includes a probe card having a probe board with a conductive path electrically connected to a tester and probes enabling to respectively contact connection pads of a semiconductor...
US20140327460 Test Apparatus and Method for Determining Long Term Reliability of an Implantable Device  
The present invention is a system and method for testing the long term reliability of an implantable device. The system provides a vessel containing temperature controlled buffered saline. A...
US20080042667 Electronic Device Test Apparatus and Method of Configuring Electronic Device Test Apparatus  
A handler is configured by, separably and connectably, a plurality of types of handling modules of different throughputs and a plurality of types of test modules of different numbers of...
US20120119769 APPARATUS FOR THERMAL TESTING OF A PRINTED CIRCUIT BOARD  
An apparatus for thermal testing of a printed circuit board being electrically energized and being unpopulated or populated with electrical or electronic components is disclosed. The apparatus...
US20090302881 Internal Memory for Transistor Outline Packages  
A transistor outline (TO) package includes a housing having a window and a substrate. Circuitry is coupled to the substrate within the housing. The circuitry comprises a laser diode and memory...
US20130285684 INSPECTION APPARATUS  
An inspection apparatus includes a probe substrate, a socket secured to the probe substrate, a heating element wire wound around the socket, a probe tip detachably connected to the socket, a stage...
US20110298630 TEST APPARATUS AND TEST METHOD  
A test apparatus comprising a plurality of test units that test a device under test; a plurality of housing sections that respectively house the test units therein; a plurality of opening/closing...
US20150109009 Systems and Methods for Conforming Device Testers to Integrated Circuit Device With Pressure Relief Valve  
The present invention relates to systems and methods for preventing over pressurization in a fluid management system used in an integrated circuit (IC) device tester. The prevention of the over...
US20140333333 SUBSTRATE EVALUATION APPARATUS AND SUBSTRATE EVALUATION METHOD USING THE SAME  
A substrate evaluation apparatus and method which includes a substrate storage portion accommodating a substrate, first and second fastening portions are arranged in the substrate storage portion...
US20150032403 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028904 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028903 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028902 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028901 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20070152690 Wafer stage and related method  
A wafer stage and related methods are disclosed. The wafer stage comprises a wafer chuck adapted to hold a wafer; lift pins adapted to pass through the wafer chuck, move vertically, and support...
US20070182433 Wafer holder, and wafer prober and semiconductor manufacturing apparatus provided therewith  
A wafer holder that includes a cooling module for rapid cooling, that can further improve the heating uniformity of a wafer, and that can be appropriately used with a wafer prober, a...
US20060186904 Wafer holder for wafer prober and wafer prober equipped with the same  
The invention provides a wafer-prober wafer holder that allows positional precision and temperature uniformity to be increased, and also allows the chip to be heated and cooled rapidly, and a...
US20140125364 SYSTEM AND METHOD FOR COMPENSATING MEASURED IDDQ VALUES  
An IDDQ test system and method that, in one embodiment,deg includes 1) an empirical extraction subsystem operable to generate an IDDQ versus temperature model for a given semiconductor device...
US20100013509 PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME  
A prober for a semiconductor wafer test includes a stage, a probe card, and an adjuster The stage has a first region and a second region other than the first region The first region is covered by...
US20140354312 TEST HANDLER, TEST CARRIER AND TEST METHOD THEREOF  
The present invention provides a test handler for various IC tests, which includes a chamber and a test carrier. The chamber is controllable to present a dry status. The test carrier is made of a...
US20140306728 ELECTRONIC ASSEMBLY TEST SYSTEM  
An example system for testing electronic assemblies (EAs) may include carriers for holding EAs and slots for testing at least some of the EAs in parallel. Each slot may be configured to receive a...
US20140055154 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH EJECTION MECHANISMS  
A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms...
US20070007986 Apparatus for hot-probing integrated semiconductor circuits on wafers  
An apparatus for hot-probing integrated semiconductor circuits on wafers is disclosed that includes a support device for accommodating the wafer, a measurement card with electronic circuitry for...
US20120268149 ELECTRICAL TEST APPARATUS FOR A PHOTOVOLTAIC COMPONENT  
The present invention relates to electrical test apparatuses for photovoltaic modules and methods of testing photovoltaic modules.
US20070247140 Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array  
Apparatus is for processing signals between a tester and devices under test. In one embodiment, the apparatus includes at least one multichip module. Each multichip module has a plurality of...
US20070126457 Wafer holder, and heating unit and wafer prober provided with the wafer holder  
A wafer holder is provided with a mounting stage having a mounting surface for mounting a wafer, and a holding member for holding the mounting stage, wherein relationships are established such...

Matches 51 - 100 out of 175 < 1 2 3 4 >