Matches 1 - 50 out of 84 1 2 >


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US20150204962 METHOD OF OPERATING TESTING SYSTEM  
A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set...
US20150130485 MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TERMINAL  
The present disclosure describes a novel method and apparatus for using a device's power and ground terminals as a test and/or debug interface for the device. According to the present disclosure,...
US20140203828 LAYOUT STRUCTURE OF ELECTRONIC ELEMENT AND TESTING METHOD OF THE SAME THEREOF  
A layout structure of an electronic element comprising an electronic matrix, a first load and a second load is disclosed. The first load couples to a first end of the electronic matrix and...
US20110291680 CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE  
A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test...
US20140021970 PROBE CARD ANALYSIS SYSTEM AND METHOD  
A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process....
US20130321012 Methods and Apparatus for Testing Small Form Factor Antenna Tuning Elements  
A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure...
US20150212186 METHOD OF CALIBRATING AND OPERATING TESTING SYSTEM  
A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method...
US20130293249 Methods for Modeling Tunable Radio-Frequency Elements  
A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the...
US20140375343 SOLAR CELL MODULE EFFICACY MONITORING SYSTEM AND MONITORING METHOD THEREFOR  
A solar cell module efficacy monitoring system includes a reference module which includes a solar power generation module and is to be maintained in a clean condition, an evaluation module which...
US20120032695 METHOD OF AND CIRCUIT FOR BROWN-OUT DETECTION  
A circuit and method for detecting a brown-out condition and providing a feed-forward transfer function in a power supply circuit. A comparison circuit is coupled to a delay element through a...
US20150241544 METHOD OF CALIBRATING AND DEBUGGING TESTING SYSTEM  
A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being...
US20150054534 METHOD OF MEASURING AND ASSESSING A PROBE CARD WITH AN INSPECTION DEVICE  
A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the...
US20060176048 Generation and use of calibration data for automated test equipment  
In one embodiment, a request to perform a calibration process for automated test equipment (ATE) is received. The request is associated with one or more test setups. After receiving the request, a...
US20140070828 METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST  
Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications....
US20110012630 DEVICE FOR CHECKING THE OPERABILITY OF A SENSOR ELEMENT  
The invention relates to a device for checking the operability of a sensor element (100) for determining the concentration of gas components in a gas mixture, particularly of the concentration of...
US20140167669 OFFSET COMPENSATION METHOD OF CURRENT SENSOR AND MOTOR DRIVING SYSTEM  
An offset compensation method of a current sensor is provided for determining whether an offset compensation of the current sensor is abnormal, and a motor driving system includes the current...
US20140278187 Multi-Touch Probe Actuator  
Example apparatus and methods concern automated testing of a capacitive touch interface (e.g., touch screen). One example apparatus includes probes that extend and retract from the apparatus under...
US20090315581 CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE  
A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test...
US20130234743 METHOD FOR TESTING COMPARATOR AND DEVICE THEREFOR  
An integrated circuit facilitates a self test routine that verifies proper operation of an analog comparator. In response to entering the self test routine, the voltage provided to an input of a...
US20130328582 Methods and Apparatus for Performing Wafer-Level Testing on Antenna Tuning Elements  
A test system for testing an antenna tuning element is provided. The test system may include a tester, a test fixture, and a probing structure. The probing structure may include probe tips...
US20110208467 CALIBRATION STANDARDS AND METHODS OF THEIR FABRICATION AND USE  
An embodiment of a calibration standard includes a substrate, a set of conductive structures fabricated on the substrate, and a conductive end structure fabricated on the substrate. The set of...
US20110156730 CHIP-BASED PROBER FOR HIGH FREQUENCY MEASUREMENTS AND METHODS OF MEASURING  
A chip-based prober for measuring a device-under-test is provided. The prober includes a probe tip, a voltage and control connector, a chip carrier, and a programmable termination chip. The probe...
US20090295417 TEST SYSTEM, ELECTRONIC DEVICE, AND TEST APPARATUS  
Provided is a test system that tests a device under test, including a plurality of internal test circuits that are provided inside the device under test and that are used for testing an operation...
US20110133764 APPARATUS AND METHOD FOR DETECTING ABNORMALITY IN SOLAR CELL POWER GENERATION SYSTEM  
The present invention provides an apparatus for easily detecting an abnormal status of power generation of a solar cell panel in a solar cell power generation system having the power generation of...
US20150061708 Detection Method of Current Sensor Faults in the E-Drive System By Using the Voltage Command Error  
Systems, apparatus, and methods detect a current sensor error in an FOC electric machine system. A voltage command is monitored to detect the presence of an ac component can indicate that an error...
US20150212185 METHOD FOR PROBE EQUALIZATION  
A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory...
US20150168531 CALIBRATION PLATE  
A substrate has a first side and a second side opposite to the first side. The substrate further has a first calibrating region and a second calibrating region on the first side, on each of which...
US20110288807 FAILURE DETECTING METHOD, SEMICONDUCTOR DEVICE, AND MICROCOMPUTER APPLICATION SYSTEM  
The present invention is directed to improve the precision of failure detection by performing the failure detection by changing an analog amount of a circuit to be subjected to the failure...
US20070103144 CALIBRATION PATTERN AND CALIBRATION JIG  
In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe head are calibrated using...
US20130271167 CURRENT TESTS FOR I/O INTERFACE CONNECTORS  
Current tests for I/O interface connectors are described. In one example a test may include applying a forced energy to a first pin of an interface of a data communications bus of an integrated...
US20090237096 Compensation Tool For Calibrating An Electronic Component Testing Machine To A Standardized Value  
A compensation tool and process is provided for calibrating each test position located at a plurality of test modules of an electronic testing machine to a standardized value. Each test module is...
US20130187674 TEST STATION FOR WIRELESS DEVICES AND METHODS FOR CALIBRATION THEREOF  
A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal...
US20130069678 EFFICIENT METHODS AND APPARATUS FOR MARGIN TESTING INTEGRATED CIRCUITS  
Method and apparatus for margin testing integrated circuits. The method includes selecting a clock frequency, an operating temperature range and a power supply voltage level for margin testing an...
US20100308851 TESTING DEVICE AND METHOD FOR DETERMINING A COMMON MODE SIGNAL OF AN ELECTRICAL TELECOMMUNICATION  
A testing device including: a first terminal configured to be connected to an equipment under test; a common-mode detector configured to detect a common-mode part of a signal emitted from the...
US20100033203 Methods And Apparatus For Translated Wafer Stand-In Tester  
A translated wafer stand-in tester, being a hybrid apparatus capable of emulating the form factor and some or all behaviors of a translated wafer under test, which is operable to store, quantify,...
US20140184253 In-tool ESD Events Monitoring Method And Apparatus  
In one embodiment of the invention, an apparatus for electrostatic discharges (ESD) events monitoring incorporating a charged device model event simulator (CDMES) unit comprises: at least one...
US20120119766 PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION  
A probe apparatus includes a movable mounting table for supporting an object to be tested; a probe card disposed above the mounting table and having a plurality of probes to come into contact with...
US20150028906 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028905 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028904 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028903 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028902 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028901 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028900 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20150028899 SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES  
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store...
US20130134999 Signal Acquisition System Having Reduced Probe Loading of a Device Under Test  
A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the...
US20060028225 Process and a device for the calibration of a semiconductor component test system  
The invention relates to a device, in particular a probe card to be used for the testing of semi-conductor components, and/or a device, in particular a probe card, to be used in the calibration of...
US20110181308 TEST APPARATUS AND TESTING METHOD  
A main power supply supplies a power supply voltage to a power supply terminal of a DUT. A control pattern generator generates a control pattern including a pulse sequence. A compensation circuit...
US20130002275 SYSTEM AND METHOD FOR MEASURING NEAR FIELD INFORMATION OF DEVICE UNDER TEST  
A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration...
US20050104616 Electric motor monitoring system  
An electric motor monitoring system is described that comprises an antenna, a data sampling means and a data processing means. The system employs the antenna to detect high frequency arcing events...

Matches 1 - 50 out of 84 1 2 >