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Matches 1 - 4 out of 4
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Document Title
1
US20090203209
Semiconductor device and method of manufacturing the same
A semiconductor device which is capable of avoiding an increase in pattern ratio and allowing wiring dummy patterns to improve global steps developed by CMP upon insertion of the dummy patterns...
2
US20090170305
METHOD FOR IMPROVING ELECTROMIGRATION LIFETIME FOR CU INTERCONNECT SYSTEMS
A method for forming a single damascene and/or dual damascene interconnect structure, comprising: performing front end processing, depositing copper, annealing the copper, performing CMP...
3
US20090108431
Inverted package-on-package (POP) assemblies and packaging methods for integrated circuits
Integrated circuit package assemblies and packaging methods are provided. An integrated circuit package assembly includes a first circuit package including a first substrate having a top surface...
4
US20080042177
Image sensor and method of fabricating the same
In one embodiment, the method includes forming a first dielectric layer over a substrate, and removing a portion of the first dielectric layer over a photoactive region of the substrate to form a...
Matches 1 - 4 out of 4