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US20070102785 SEMICONDUCTOR DEVICE WITH FUSE AND METHOD OF FABRICATING THE SAME  
A semiconductor device having a fuse and a method of fabricating the same are provided. An embodiment of he semiconductor device includes a fuse pattern having a fuse conductive pattern disposed...
US20090102013 FUSE BOX AND METHOD OF FORMING THE SAME  
A fuse box includes a fuse pattern having a rugged profile and an interlayer insulating film including a fuse blowing window to fill the fuse pattern.
US20100320561 Method for forming a one-time programmable metal fuse and related structure  
According to one exemplary embodiment, a method for forming a one-time programmable metal fuse structure includes forming a metal fuse structure over a substrate, the metal fuse structure...
US20120217613 Programmable Fuse  
According to one exemplary embodiment, a method for forming a one-time programmable metal fuse structure includes forming a metal fuse structure over a substrate, the metal fuse structure...
US20120286390 ELECTRICAL FUSE STRUCTURE AND METHOD FOR FABRICATING THE SAME  
An electrical fuse structure includes a top fuse, a bottom fuse and a via conductive layer positioned between the top fuse and the bottom fuse for providing electric connection. The top fuse...
US20140197517 TRIMMING CIRCUIT FOR AN INTEGRATED CIRCUIT AND RELATED INTEGRATED DEVICE  
A trimming circuit is configured to carry out a trimming operation on a device portion of an integrated circuit device. The trimming circuit includes: shunt fuses wherein each shunt fuse is...
US20130043556 SIZE-FILTERED MULTIMETAL STRUCTURES  
A size-filtered metal interconnect structure allows formation of metal structures having different compositions. Trenches having different widths are formed in a dielectric material layer. A...
US20120261794 DESIGN STRUCTURE FOR INTERCONNECT STRUCTURE CONTAINING VARIOUS CAPPING MATERIALS FOR ELECTRICAL FUSE AND OTHER RELATED APPLICATIONS  
A design structure is provided for interconnect structures containing various capping materials for electrical fuses and other related applications. The structure includes a first interconnect...
US20130168807 INTERCONNECT STRUCTURE CONTAINING VARIOUS CAPPING MATERIALS FOR ELECTRICAL FUSE AND OTHER RELATED APPLICATIONS, AND DESIGN STRUCTURE THEREOF  
A structure and design structure is provided for interconnect structures containing various capping materials for electrical fuses and other related applications. The structure includes a first...
US20150130019 ELECTRONIC FUSE HAVING AN INSULATION LAYER  
A structure including a dual damascene feature in a dielectric layer, the dual damascene feature including a first via, a second via, and a trench, the first via, the second via being filled with...
US20080211059 ELECTRONIC FUSE HAVING HEAT SPREADING STRUCTURE  
A semiconductor device includes a fuse transistor for fuse programming and a fuse block connected to the fuse transistor, wherein the fuse block comprises a fuse line and a heat spreading...
US20110169127 STRUCTURE FOR INTERCONNECT STRUCTURE CONTAINING VARIOUS CAPPING MATERIALS FOR ELECTRICAL FUSE AND OTHER RELATED APPLICATIONS  
A design structure is provided for interconnect structures containing various capping materials for electrical fuses and other related applications. The structure includes a first interconnect...
US20130082347 One Time Programmable Structure Using a Gate Last High-K Metal Gate Process  
An eFuse structure having a first metal layer serving as a fuse with a gate including an undoped polysilicon (poly), a second metal layer and a high-K dielectric layer all formed on a silicon...
US20130320488 SYSTEM AND METHOD FOR FORMING ALUMINUM FUSE FOR COMPATIBILITY WITH COPPER BEOL INTERCONNECT SCHEME  
A semiconductor fuse device and a method of fabricating the fuse device including a last metal interconnect layer including at least two discrete metal conductors, an inter-level dielectric layer...
US20080296726 Fuse Structure for Maintaining Passivation Integrity  
A fuse structure (106) includes a patterned conductor disposed over a passivation layer (302), which is disposed over a substrate (110), such as, for example, an inter-layer dielectric layer of an...
US20150214149 E-FUSE STRUCTURE WITH METHODS OF FUSING THE SAME AND MONITORING MATERIAL LEAKAGE  
The present disclosure generally provides for an e-fuse structure and corresponding method for fusing the same and monitoring material leakage. The e-fuse structure can include a metal dummy...
US20130026466 TESTING ARCHITECTURE OF CIRCUITS INTEGRATED ON A WAFER  
An embodiment of a testing architecture of integrated circuits on a wafer is described of the type including at least one first circuit of a structure TEG realized in a scribe line providing...
US20140264731 PROGRAMMABLE E-FUSE FOR AN INTEGRATED CIRCUIT PRODUCT  
One illustrative e-fuse device disclosed herein includes first and second conductive structures, a first electrically conductive heat cage element that is conductively coupled to the first...
US20110147853 Method of Forming an Electrical Fuse and a Metal Gate Transistor and the Related Electrical Fuse  
The present invention provides a method of integrating an electrical fuse process into a high-k/metal gate process. The method simultaneously forms a dummy gate stack of a transistor and a dummy...
US20080179709 INTEGRATED CIRCUIT FUSE  
An integrated circuit and a fuse therefore are disclosed. The integrated circuit fuses includes a plurality of terminals coupled by a fuse element, wherein the fuse element is located in a...
US20140203396 Electrical Fuse Structure and Method of Formation  
An embodiment is a fuse structure. In accordance with an embodiment, a fuse structure comprises an anode, a cathode, a fuse link interposed between the anode and the cathode, and cathode...
US20110101493 Electrical Fuse Structure and Method of Formation  
An embodiment is a fuse structure. In accordance with an embodiment, a fuse structure comprises an anode, a cathode, a fuse link interposed between the anode and the cathode, and cathode...
US20140239439 ELECTRICAL FUSES AND METHODS OF MAKING ELECTRICAL FUSES  
A fuse, a method of making the fuse and a circuit containing the fuse. The fuse includes an electrically conductive and conformal liner on sidewalls and the bottom of a trench; a copper layer on...
US20120126363 STRUCTURE OF METAL E-FUSE  
Structures of electronic fuses (e-fuse) are provided. An un-programmed e-fuse includes a via of a first conductive material having a bottom and sidewalls with a portion of the sidewalls being...
US20060163685 THERMO-MECHANICAL CLEAVABLE STRUCTURE  
A thermo-mechanical cleavable structure is provided and may be used as a programmable fuse for integrated circuits. As applied to a programmable fuse, the thermo-mechanical cleavable structure...
US20080217734 Multi-level electrical fuse using one programming device  
A multi-level electrical fuse system comprises at least one fuse box having at least one electrical fuse, a programming device serially coupled to the electrical fuse, and a variable power supply...
US20130071998 Electrical Fuse With Metal Line Migration  
An electrical fuse device is disclosed. A circuit apparatus can include the fuse device, a first circuit element and a second circuit element. The fuse includes a first contact that has a first...
US20070290296 Fuse Structures and Methods of Forming the Same  
A fuse structure includes an insulating structure, a fuse pattern, an insulating pattern and an insulating layer. The insulating structure has a fuse region and a wire region proximate the fuse...
US20130119509 FORMING BEOL LINE FUSE STRUCTURE  
In one embodiment, the invention provides a back-end-of-line (BEOL) line fuse structure. The BEOL line fuse structure includes: a line including a plurality of grains of conductive crystalline...
US20070007621 Fuse breakdown method adapted to semiconductor device  
A plurality of pulses each having relatively low energy are consecutively applied to a subject fuse to cause breakdown, wherein the total energy of pulses is set in light of a prescribed breakdown...
US20140319651 Electrical Fuse Structure and Method of Formation  
A fuse device having contacts configured to reduce electro-migration is disclosed. In some exemplary embodiments, the fuse structure includes an anode disposed at a first end and a cathode...
US20090294900 Fuse Device  
Implementations are presented herein that relate to a fuse device, an integrated circuit including a fuse device, a method of implementing a fuse device and a method of programming a fuse device.
US20120012976 FUSE STRUCTURE HAVING CRACK STOP VOID, METHOD FOR FORMING AND PROGRAMMING SAME, AND DESIGN STRUCTURE  
The disclosure relates generally to fuse structures, methods of forming and programming the same, and more particularly to fuse structures having crack stop voids. The fuse structure includes a...
US20130307116 Method and System for Split Threshold Voltage Programmable Bitcells  
A bitcell can include an insulating area, a first doping, a second doping, and a gate terminal for the insulating area. The second doping can be proximate to the first doping and proximate to the...
US20150155238 MAKING AN EFUSE  
A wafer chip and a method of designing the chip is disclosed. A first fuse is formed having a first critical dimension and a second fuse having a second critical dimension are formed in a layer of...
US20140367826 MAKING AN EFUSE  
A wafer chip and a method of designing the chip is disclosed. A first fuse is formed having a first critical dimension and a second fuse having a second critical dimension are formed in a layer of...
US20150021736 ELECTRONIC FUSE LINE WITH MODIFIED CAP  
An electronic fuse structure having an Mx level including an Mx dielectric, a fuse line, an Mx cap dielectric above at least a portion of the Mx dielectric, and a modified portion of the Mx cap...
US20140210040 ELECTRONIC FUSE LINE WITH MODIFIED CAP  
An electronic fuse structure having an Mx level including an Mx dielectric, a fuse line, an Mx cap dielectric above at least a portion of the Mx dielectric, and a modified portion of the Mx cap...
US20150137312 METAL FUSE STRUCTURE FOR IMPROVED PROGRAMMING CAPABILITY  
Structure providing more reliable fuse blow location, and method of making the same. A vertical metal fuse blow structure has, prior to fuse blow, an intentionally damaged portion of the fuse...
US20070190751 Semiconductor fuses and methods for fabricating and programming the same  
A fuse for use in semiconductor devices, semiconductor devices including the fuse, methods of fabricating the fuse, and methods of using the fuse. The fuse includes terminals and a programmable...
US20090174028 Fuse in a Semiconductor Device and Method for Forming the Same  
A fuse of a semiconductor device, and a method for forming the same, wherein the fuse includes a zigzag-shaped fuse portion on a planar structure, thereby reducing energy when the fuse is cut. The...
US20080122026 STRUCTURE FOR CREATION OF A PROGRAMMABLE DEVICE  
The invention is directed to an improved eFUSE that prevent rupturing of the fuse link, reduces current through the fuse link, and optimizes electromigration through the fuse link through the use...
US20080036031 FUSE BOX FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME  
A fuse box for a semiconductor device is disclosed and includes a first fuse group comprising a plurality of first fuses, arranged in a first direction and having a first cutting axis, each first...
US20140021578 VERTICAL ELECTRONIC FUSE  
An electronic fuse structure including a first Mx metal comprising a conductive cap, an Mx+1 metal located above the Mx metal, wherein the Mx+1 metal does not comprise a conductive cap, and a via,...
US20080296727 Programmable poly fuse  
According to one exemplary embodiment, a programmable poly fuse includes a P type resistive poly segment forming a P-N junction with an adjacent N type resistive poly segment. The programmable...
US20140070362 E-FUSE STRUCTURES AND METHODS OF MANUFACTURE  
E-fuse structures in back end of the line (BEOL) interconnects and methods of manufacture are provided. The method includes forming an interconnect via in a substrate in alignment with a first...
US20120326269 E-FUSE STRUCTURES AND METHODS OF MANUFACTURE  
E-fuse structures in back end of the line (BEOL) interconnects and methods of manufacture are provided. The method includes forming an interconnect via in a substrate in alignment with a first...
US20080217733 ELECTRICAL FUSE STRUCTURE FOR HIGHER POST-PROGRAMMING RESISTANCE  
The present invention provides an electrical fuse structure for achieving a post-programming resistance distribution with higher resistance values and to enhance the reliability of electrical fuse...
US20130241031 PROGRAMMABLE FUSE STRUCTURE AND METHODS OF FORMING  
Methods of forming an electrically programmable fuse (e-fuse) structure and the e-fuse structure are disclosed. Various embodiments of forming the e-fuse structure include: forming a dummy poly...
US20120112312 Integrated Circuit Chip Customization Using Backside Access  
An integrated circuit, a method for making an integrated circuit product, and methods for customizing an integrated circuit are disclosed. Integrated circuit elements including programmable...