DIFFERENTIAL EMISSION X-RAY GAUGING APPARATUS AND METHOD USING TWO MONOCHROMATIC X-RAY BEAMS OF BALANCED INTENSITY
United States Patent 3525863
US Patent References:
X-ray photometer
- - 2610301
Spectroscopy
- - 2897371
Fluorescence analysis
- - 2925497
Non-contacting thickness gauges
- - 2963585
Chi-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors
- - 3114832
X-ray photometer
- - 2610301
Spectroscopy
- - 2897371
Fluorescence analysis
- - 2925497
Non-contacting thickness gauges
- - 2963585
Chi-ray spectroscopic system comprising plural sources, filters, fluorescent radiators, and comparative detectors
- - 3114832
Inventors:
Constantine, Nikiforos
Hill, Robert C.
Hill, Robert C.
Publication Date:
08/25/1970
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Assignee:
MINNESOTA MINING & MFG
Primary Class:
Other Classes:
378/160, 250/399, 378/143, 378/141, 378/137, 378/124
International Classes:
G01N23/223; G01N23/22; G01N23/22
US Patent References:
| 3417243 | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |