Title:
EXTERNAL STANDARD METHOD OF X-RAY DIFFRACTION ANALYSIS FOR DETERMINING THE PERCENTAGE OF COMPOUNDS IN CEMENT CLINKER
United States Patent 3428802
Inventors:
Mehta, Povindar K.
Shah, Manesh J.
Application Number:
US3428802DA
Publication Date:
02/18/1969
Filing Date:
04/11/1966
Assignee:
IBM
Primary Class:
International Classes:
G01N23/207; (IPC1-7): G01N23/20
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