Method for nondestructive testing by using a defocussed electron beam
United States Patent 3162767
US Patent References:
Machine for detecting flaws
- - 1640567
Flaw detection
- - 2259400
Apparatus for evaporating and depositing a material
- - 2746420
Methods and devices for performing spectrum analysis, in particular in the far ultraviolet region
- - 3049618
Machine for detecting flaws
- - 1640567
Flaw detection
- - 2259400
Apparatus for evaporating and depositing a material
- - 2746420
Methods and devices for performing spectrum analysis, in particular in the far ultraviolet region
- - 3049618
Inventors:
Curcio, Robert DI. A.
Stillwell Jr., Willard F.
Stillwell Jr., Willard F.
Publication Date:
12/22/1964
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Export Citation:
Assignee:
UNITED AIRCRAFTG CORP
Primary Class:
Other Classes:
219/121.690, 219/121.120, 219/121.230, 219/121.150, 219/121.310, 219/121.350, 73/104, 250/492.200, 219/121.190
International Classes:
B23K15/00; G01N23/225; H01C17/24; H01J37/30; H01J37/302; H01J37/305; H01L49/02; G01N23/22; H01C17/22
Foreign References:
| RU125392A |