Chi-ray fluorescent spectrometry
United States Patent 2783385
US Patent References:
X-ray diffraction apparatus for use with radioactive materials
- - 2532810
X-ray spectrometer
- - 2540821
Apparatus for determining coating thickness
- - 2578722
X-ray diffraction apparatus for use with radioactive materials
- - 2532810
X-ray spectrometer
- - 2540821
Apparatus for determining coating thickness
- - 2578722
Inventors:
Sjoerd, Wytzes
Publication Date:
02/26/1957
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Assignee:
HARTFORD NAT BANK & TRUST CO
Primary Class:
Other Classes:
378/83, 378/145
International Classes:
G01N23/207; G01N23/223; G01N23/20; G01N23/22